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Noise in Magnetoresistive Devices

Introduction

In 2005 INESC-MN installed an experimental setup for noise measurements using a spectrum analyzer operating from DC up to 8 GHz. There are two main targets: 1) to characterize the high frequency magnetic noise spectrum (caused by thermally excited spin ringing) of sub-micron sized Spin Valve and Magnetic Tunnel Junction stacks. The results will help to optimize the devices electrical and magnetic properties in the high frequency range, while spin dynamics parameters (such as the phenomenological damping parameter α) can be extracted from the high frequency noise spectrum. 2) Measure the magnetic sensitivity of magnetic field sensors in the thermal and shoot noise background. Excite spin valve and magnetic tunnel junction devices with local magnetic fields created and measure and optimize the minimum detectable field of the magnetoresistive sensors.

For more information on this topic, contact Paulo Freitas or Susana Cardoso Freitas.

Main Results

  1.  Setup for noise measurements using a spectrum analyzer (from DC to 8GHz), installed at INESC-MN since 2005.

  2. Noise measurements on AlOx and MgO-based junctions, as well as in spin valve sensors have been carried out.

    • Noise spectrum  of MgO tunnel junctions, obtained at several bias currents. The curves were fitted to the theoretical 1/f noise expression and the Hooge constant αH=1.24x10-9 μm2 was obtained. Noise background levels in the range of 10-12 T/Hz0.5 can be achieved at room temperature. Such small sensitivities are currently only at the reach of squid sensors, which require low temperatures in order to operate.

    • Noise measurements on hybrid devices, consisting of spin valve sensors in CoZrNb flux guide structures. It is observed that down to 60 pT/Hz0.5, no excess noise is observed coming from the flux guide.

    • Results on commercial device incorporating a spin valve sensor, done in collaboration with Neocera (USA). Neocera fabricates non-contact, non-destructive imaging tools for the Semiconductor industry's devices, advanced packages, and full assemblies, using scanning SQUID microscope imaging systems, and has successfully incorporated spin valve sensors in their most recent products (2006). Several wafers have been microfabricated at INESC-MN, either using spin valves and tunnel junctions. Then, at Neocera, the polishing of the spin-valve probes yielded tips of less than 50μm x 50μm cross section; at a height of 100 μm from the sensor, the cross section can be less than 100μm x 75μm.The magnetic noise characteristic for a polished device is shown. The noise level near 100 kHz is below 10 nT/Hz0.5. 

Projects and Collaborations 2004 - present

Industrial Collaborations

  • Singulus (Germany)

  • Neocera (USA)


Copyright © 2010 INESC MN; all rights reserved · Last update:27 October 2011 ·